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Randomness-efficient Low Degree Tests and Short PCPs via Epsilon-Biased Sets
Submitted by
smcneil
on Mon, 2012-01-16 00:00
Author:
E. Ben-Sasson
M. Sudan
S. Vadhan
A. Wigderson
Publication:
35th Annual ACM Symposium, Symposium on Theory of Computing (STOC) 2003, pp. 612-621, 2003.
Year:
2003
Abstract:
http://www.math.ias.edu/~avi/PUBLICATIONS/ABSTRACT/BSVW03.pdf
Files
File:
Proceedings version (pdf)
Proceedings version (ps)
bibTeX
‹ Randomness vs. Time: De-randomization under a uniform assumption
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